I. Overview of functional and structural features         

Basic functions: ST2571-F03 film square resistance rectangular four point probe, rectangular 2X2mm needle pitch, with spherical tip gold plated phosphor copper alloy probe, equipped with four probe instrument and test bench, is used to test the resistivity/square resistance of conductive film (ITO film) or nano coating and other semiconductor materials on flexible material conductive film, metal coating or film, ceramic or glass substrate.

Basic composition: the complete set of probes consists of removable probes, probe bases, hand-held jackets, test bench connecting units, instrument connecting cables and other components.

Matching and compatibility: This probe is compatible with all four probe instruments and four probe test benches of our company. The main models in the table below are compatible with our test benches and four probe instruments of most other manufacturers.

List of models and names of applicable products of ST2571-F03 film square resistance rectangular four probe

 II. Main Technical Parameters and Description            

1.  It can measure sheet, block or bar. Minimum sample size 2mm × 2mm, the maximum plane size is determined by the equipped test bench, and the hand-held probe mode is not limited.

2.1 Probe spacing: rectangular 2X2mm.

2.2 Mechanical displacement rate of probe: ± 0.5%.

2.3 Probe: gold plated phosphor copper alloy, Φ 0.75mm。

2.4 Pressure: 0~500g adjustable, and the rated pressure is about 400g.

3.  The probe can be quickly disassembled and replaced, which is convenient for the production line to use frequently.

 III. Usage                                                                         

Please refer to the usage of each supporting test bench.

 IV. Contact Information and Purchase Channel             

Sales Manager: Grace Zheng

Tel.:+8618762109211

Email: zhengjingjing@szjgdz888.com

Alibaba Store: https://szjgdz.en.alibaba.com